16 results
Low Voltage Soft X-ray Emission Analysis from 100V for Depth Chemical Information from a few nm to several hundred nm
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- Journal:
- Microscopy and Microanalysis / Volume 22 / Issue S3 / July 2016
- Published online by Cambridge University Press:
- 25 July 2016, pp. 422-423
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- July 2016
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Trace Element Analysis under 100 ppm and Chemical State Analysis in Small Area using Wavelength Dispersive Soft X-ray Emission Spectrometer in FE-SEM
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- Microscopy and Microanalysis / Volume 21 / Issue S3 / August 2015
- Published online by Cambridge University Press:
- 23 September 2015, pp. 1635-1636
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- August 2015
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Exciting Possibilities of Soft X-ray Emission Spectroscopy as Chemical State Analysis in EPMA and FESEM
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 684-685
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- August 2014
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Present State of TEM-SXES Analysis and its Application to SEM aiming Chemical Analysis of Bulk Materials
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- Microscopy and Microanalysis / Volume 20 / Issue S3 / August 2014
- Published online by Cambridge University Press:
- 27 August 2014, pp. 682-683
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- August 2014
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Chemical State Mapping via Soft X-rays using a Wavelength Dispersive Soft X-ray Emission Spectrometer with High Energy Resolution
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1258-1259
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- August 2013
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Construction of a SXES spectrometer for a conventional SEM
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
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- 09 October 2013, pp. 1278-1279
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- August 2013
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Characteristics in valence-band emission spectra of simple metals and transition metals obtained by SXES-TEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 938-939
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- July 2012
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High spatial resolution X-ray spectra of Mg, Al, Si and P L-emission observed with a newly developed soft X-ray spectrometer for EPMA
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 776-777
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- July 2012
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High Energy-Resolution EELS and SXES Studies on Characteristic Chemical Shifts and Charge Transfer in Al-Si-Mn and Zn-Mg-Zr Alloys
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1884-1885
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- July 2011
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An Extension up to 4 keV by a Newly Developed Multilayer-Coated Grating for TEM-SXES Spectrometer
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 604-605
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- July 2011
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Li K-Emission Measurements Using a Newly Developed SXES-TEM Instrument
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 1308-1309
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- July 2010
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A Soft X-ray Emission Specrometer with High-energy Resolution for Electron Probe Microanalysis
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
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- 01 August 2010, pp. 34-35
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- July 2010
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High Energy-Resolution Electron Energy-Loss Spectroscopy Study of the Electronic Structures of One-Dimensional Nano-Scale Materials
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
- Published online by Cambridge University Press:
- 05 August 2007, pp. 744-745
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- August 2007
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Development of Automatic Magnification Calibration Function for Scanning Transmission Electron Microscope
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 752-753
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- August 2005
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Atomic Structures of Oxygen-associated Defects in Sintered Aluminum Nitride Ceramics
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- Microscopy and Microanalysis / Volume 5 / Issue 5 / September 1999
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- 08 August 2002, pp. 352-357
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- September 1999
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Preparation and Characterization of Nanocomposite Composed of TiO2 as Active Matrix
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- MRS Online Proceedings Library Archive / Volume 457 / 1996
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- 10 February 2011, 425
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- 1996
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